High resolution HAADF-STEM imaging analysis of N related defects in GaNAs quantum wells

  1. Herrera, M.
  2. Ramasse, Q.
  3. Browning, N.D.
  4. Pizarro, J.
  5. Galindo, P.L.
  6. Gonzalez, D.
  7. Garcia, R.
  8. Du, M.W.
  9. Zhang, S.B.
  10. Hopkinson, M.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276 1435-8115

Année de publication: 2008

Volumen: 14

Número: SUPPL. 2

Pages: 318-319

Type: Communication dans un congrès

DOI: 10.1017/S1431927608082329 GOOGLE SCHOLAR