Publicaciones en las que colabora con ELISA GUERRERO VAZQUEZ (15)

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2019

  1. Topological homogeneity for electron microscopy images

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

2018

  1. Application of super-resolution techniques to transmission electron microscopy images

    Frontiers in Artificial Intelligence and Applications

  2. Correcting sample drift using Fourier harmonics

    Micron, Vol. 110, pp. 18-27

2017

  1. Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging

    Ultramicroscopy, Vol. 182, pp. 283-291

2016

  1. (S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications

    Microscopy and Microanalysis

  2. Strain mapping accuracy improvement using super-resolution techniques

    Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58

2013

  1. Photoluminescence enhancement of InAs(Bi) quantum dots by bi clustering

    Applied Physics Express, Vol. 6, Núm. 4

2009

  1. High resolution electron microscopy of GaAs capped GaSb nanostructures

    Applied Physics Letters, Vol. 94, Núm. 4

2007

  1. Error quantification in strain mapping methods

    Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328

  2. The Peak Pairs algorithm for strain mapping from HRTEM images

    Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193

2005

  1. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    14th Conference, April 11-14, 2005, Oxford, UK

  2. Quantification of the influence of TEM operation parameters on the error of HREM image matching

    MICROSCOPY OF SEMICONDUCTING MATERIALS

  3. Strain mapping from HRTEM images

    MICROSCOPY OF SEMICONDUCTING MATERIALS

2003

  1. On the application of advanced computing techniques for the determination of thickness and defocus from high resolution transmission electron microscopy images

    10th International Ceramics Congress and 3rd Forum on New Materials, Florence, Italy, July 14-18, 2002