EMILIO JOSE
MARQUEZ NAVARRO
Catedrático de Universidad
Publicaciones (104) Publicaciones en las que ha participado algún/a investigador/a
2024
2023
-
Complex dielectric function of H-free a-Si films: Photovoltaic light absorber
Materials Letters, Vol. 345
-
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample
Nanomaterials, Vol. 13, Núm. 17
-
Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber
Coatings, Vol. 13, Núm. 7
2022
-
Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films
Coatings, Vol. 12, Núm. 10
-
Comparison of Optical Characterization Methods for Transmission Spectroscopy
Optics InfoBase Conference Papers
-
Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si
Journal of Non-Crystalline Solids, Vol. 594
-
Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region
Materials, Vol. 15, Núm. 23
2021
-
Further increasing the accuracy of characterization of a thin dielectric or semiconductor film on a substrate from its interference transmittance spectrum
Materials, Vol. 14, Núm. 16
-
Optical characterization of H-free a-Si layers grown by rf-magnetron sputtering by inverse synthesis using matlab: Tauc–lorentz–urbach parameterization
Coatings, Vol. 11, Núm. 11
2020
-
Optical transmittance for strongly-wedge-shaped semiconductor films: Appearance of envelope-crossover points in amorphous as-based chalcogenide materials
Coatings, Vol. 10, Núm. 11, pp. 1-23
-
Perfecting the dispersion model free characterization of a thin film on a substrate specimen from its normal incidence interference transmittance spectrum
Thin Solid Films, Vol. 706
-
Spectroscopic ellipsometry study of non-hydrogenated fully amorphous silicon films deposited by room-temperature radio-frequency magnetron sputtering on glass: Influence of the argon pressure
Journal of Non-Crystalline Solids, Vol. 547
2019
-
Comparative study of the accuracy of characterization of thin films a-Si on glass substrates from their interference normal incidence transmittance spectrum by the Tauc-Lorentz-Urbach, the Cody-Lorentz-Urbach, the optimized envelopes and the optimized graphical methods
Materials Research Express, Vol. 6, Núm. 3
-
The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates
Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43
2018
-
Insights into the annealing process of sol-gel TiO 2 films leading to anatase development: The interrelationship between microstructure and optical properties
Applied Surface Science, Vol. 439, pp. 736-748
-
Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
Thin Solid Films, Vol. 645, pp. 370-378
2017
-
Development of algorithm for computer drawing envelopes of interference reflectance spectra for thin film specimens
Optik, Vol. 132, pp. 320-328
-
Optical characterization of amine-solution-processed amorphous AsS2 chalcogenide thin films by the use of transmission spectroscopy
Journal of Alloys and Compounds, Vol. 721, pp. 363-373
-
Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum
Measurement Science and Technology, Vol. 28, Núm. 3