Publicaciones en colaboración con investigadores/as de Oak Ridge National Laboratory (25)

2011

  1. Calculation of integrated intensities in aberration-corrected Z-contrast images

    Journal of Electron Microscopy, Vol. 60, Núm. 1, pp. 29-33

  2. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

    Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581

  3. Distribution of bismuth atoms in epitaxial GaAsBi

    Applied Physics Letters, Vol. 98, Núm. 10

  4. Seeing inside materials by aberration-corrected electron microscopy

    International Journal of Nanotechnology, Vol. 8, Núm. 10-12, pp. 935-947

  5. Structural origin of enhanced luminescence efficiency of antimony irradiated InAs quantum dots

    Advanced Science Letters, Vol. 4, Núm. 11-12, pp. 3776-3778

2008

  1. A method to determine the strain and nucleation sites of stacked nano-objects

    Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426

  2. Experimental and simulated strain field maps in stacked quantum wires

    Microscopy and Microanalysis

  3. Point defect configurations of supersaturated Au atoms inside Si nanowires

    Nano Letters, Vol. 8, Núm. 4, pp. 1016-1019