Publicaciones en colaboración con investigadores/as de Korea Basic Science Institute (2)

2011

  1. Seeing inside materials by aberration-corrected electron microscopy

    International Journal of Nanotechnology, Vol. 8, Núm. 10-12, pp. 935-947

2009

  1. Aberration-corrected scanning transmission electron microscopy: From atomic imaging and analysis to solving energy problems

    Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 367, Núm. 1903, pp. 3709-3733