PEDRO LUIS
GALINDO RIAÑO
Catedrático de Universidad
Publicaciones en las que colabora con PEDRO LUIS GALINDO RIAÑO (51)
2020
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CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image
Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920
2019
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Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells
Journal of Alloys and Compounds, Vol. 792, pp. 1021-1027
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Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials
Journal of Microscopy, Vol. 273, Núm. 1, pp. 81-88
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Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures
Journal of Materials Science, Vol. 54, Núm. 4, pp. 3230-3241
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Topological homogeneity for electron microscopy images
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2018
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Application of super-resolution techniques to transmission electron microscopy images
Frontiers in Artificial Intelligence and Applications
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Correcting sample drift using Fourier harmonics
Micron, Vol. 110, pp. 18-27
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Gaussian kernel density functions for compositional quantification in atom probe tomography
Materials Characterization, Vol. 139, pp. 63-69
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HAADF-STEM for the analysis of core–shell quantum dots
Journal of Materials Science, Vol. 53, Núm. 21, pp. 15226-15236
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Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells
Journal of Alloys and Compounds, Vol. 763, pp. 1005-1011
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Neural networks applied to the determination of thickness and defocus from high resolution transmission electron microscopy images
Microscopy of Semiconducting Materials 2003 (CRC Press), pp. 23-26
2017
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Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging
Ultramicroscopy, Vol. 182, pp. 283-291
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Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques
Microscopy & Microanalysis 2017
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Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells
Applied Surface Science, Vol. 395, pp. 98-104
2016
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Strain mapping accuracy improvement using super-resolution techniques
Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58
2014
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A methodology for the extraction of quantitative information from electron microscopy images at the atomic level
Journal of Physics: Conference Series
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Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging
Ultramicroscopy, Vol. 146, pp. 33-38
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Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics
European Physical Journal B, Vol. 87, Núm. 11
2012
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High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62
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Quantification of corrugation in simulated graphene by electron tomography techniques
Applied Physics Letters, Vol. 101, Núm. 21