Publicaciones en las que colabora con PEDRO LUIS GALINDO RIAÑO (51)

2020

  1. CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image

    Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920

2019

  1. Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells

    Journal of Alloys and Compounds, Vol. 792, pp. 1021-1027

  2. Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials

    Journal of Microscopy, Vol. 273, Núm. 1, pp. 81-88

  3. Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures

    Journal of Materials Science, Vol. 54, Núm. 4, pp. 3230-3241

  4. Topological homogeneity for electron microscopy images

    Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

2016

  1. Strain mapping accuracy improvement using super-resolution techniques

    Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

  2. Quantification of corrugation in simulated graphene by electron tomography techniques

    Applied Physics Letters, Vol. 101, Núm. 21