ELISA
GUERRERO VAZQUEZ
Profesora Titular de Universidad
Publicaciones en las que colabora con ELISA GUERRERO VAZQUEZ (22)
2020
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CDrift: An Algorithm to Correct Linear Drift from A Single High-Resolution STEM Image
Microscopy and Microanalysis, Vol. 26, Núm. 5, pp. 913-920
2019
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Influence of the crosstalk on the intensity of HAADF-STEM images of quaternary semiconductor materials
Journal of Microscopy, Vol. 273, Núm. 1, pp. 81-88
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Topological homogeneity for electron microscopy images
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2018
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Application of super-resolution techniques to transmission electron microscopy images
Frontiers in Artificial Intelligence and Applications
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Correcting sample drift using Fourier harmonics
Micron, Vol. 110, pp. 18-27
2017
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Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging
Ultramicroscopy, Vol. 182, pp. 283-291
2016
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(S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications
Microscopy and Microanalysis
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Strain mapping accuracy improvement using super-resolution techniques
Journal of Microscopy, Vol. 262, Núm. 1, pp. 50-58
2014
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A methodology for the extraction of quantitative information from electron microscopy images at the atomic level
Journal of Physics: Conference Series
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Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics
European Physical Journal B, Vol. 87, Núm. 11
2013
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Photoluminescence enhancement of InAs(Bi) quantum dots by bi clustering
Applied Physics Express, Vol. 6, Núm. 4
2011
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Distribution of bismuth atoms in epitaxial GaAsBi
Applied Physics Letters, Vol. 98, Núm. 10
2010
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Through-focal HAADF-STEM of buried nanostructures
Journal of Physics: Conference Series
2009
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Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures
Applied Physics Letters, Vol. 95, Núm. 14
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High resolution electron microscopy of GaAs capped GaSb nanostructures
Applied Physics Letters, Vol. 94, Núm. 4
2008
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Simulation of high angle annular dark field scanning transmission electron microscopy images of large nanostructures
Applied Physics Letters, Vol. 93, Núm. 15
2007
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Error quantification in strain mapping methods
Microscopy and Microanalysis, Vol. 13, Núm. 5, pp. 320-328
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The Peak Pairs algorithm for strain mapping from HRTEM images
Ultramicroscopy, Vol. 107, Núm. 12, pp. 1186-1193
2005
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Quantification of the influence of TEM operation parameters on the error of HREM image matching
14th Conference, April 11-14, 2005, Oxford, UK
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Quantification of the influence of TEM operation parameters on the error of HREM image matching
MICROSCOPY OF SEMICONDUCTING MATERIALS