Publicaciones en colaboración con investigadores/as de University of Hannover (8)

2003

  1. HRTEM study of AlxGa1-xN/AlN DBR mirrors

    Diamond and Related Materials, Vol. 12, Núm. 3-7, pp. 1178-1181

2001

  1. Critical thickness of high-temperature AIN interlayers in GaN on sapphire (0001)

    Journal of Electronic Materials

  2. Structural characterization of high temperature AlN intermediate layer in GaN grown by molecular beam epitaxy

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 80, Núm. 1-3, pp. 299-303

2000

  1. High temperature AlN intermediate layer in GaN grown by molecular beam epitaxy

    Journal of Crystal Growth, Vol. 216, Núm. 1, pp. 15-20