Publicaciones en las que colabora con BEATRIZ VALLEJO JURADO (6)

2013

  1. X-ray topography study of monocrystalline silicon wafers diffused with phosphorus by different methods

    Applied Physics A: Materials Science and Processing, Vol. 113, Núm. 2, pp. 531-536

2005

  1. Characterization of TiO2 deposited on textured silicon wafers by atmospheric pressure chemical vapour deposition

    Solar Energy Materials and Solar Cells, Vol. 86, Núm. 3, pp. 299-308

  2. Patterns of ferroelectric domains in LiNbO3 crystals characterized by X-ray topography

    Journal of Applied Crystallography, Vol. 38, Núm. 6, pp. 1012-1019