Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Instituto de investigación
JOSE MANUEL
DIAZ MORENO
Catedrático de Escuela Universitaria
Publicaciones en las que colabora con JOSE MANUEL DIAZ MORENO (6)
2022
-
Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si
Journal of Non-Crystalline Solids, Vol. 594
2020
2019
-
The influence of Ar pressure on the structure and optical properties of non-hydrogenated a-Si thin films grown by rf magnetron sputtering onto room-temperature glass substrates
Journal of Non-Crystalline Solids, Vol. 517, pp. 32-43
2018
-
Optimisation of the envelope method for characterisation of optical thin film on substrate specimens from their normal incidence transmittance spectrum
Thin Solid Films, Vol. 645, pp. 370-378
2017
-
Optical characterization of amine-solution-processed amorphous AsS2 chalcogenide thin films by the use of transmission spectroscopy
Journal of Alloys and Compounds, Vol. 721, pp. 363-373
-
Optimization of the graphical method of Swanepoel for characterization of thin film on substrate specimens from their transmittance spectrum
Measurement Science and Technology, Vol. 28, Núm. 3