Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Instituto de investigación
Northwestern University
Evanston, Estados UnidosPublicaciones en colaboración con investigadores/as de Northwestern University (9)
2024
2023
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Complex dielectric function of H-free a-Si films: Photovoltaic light absorber
Materials Letters, Vol. 345
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Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber
Coatings, Vol. 13, Núm. 7
2022
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Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films
Coatings, Vol. 12, Núm. 10
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Comparison of Optical Characterization Methods for Transmission Spectroscopy
Optics InfoBase Conference Papers
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Energy-band-structure calculation by below-band-gap spectrophotometry in thin layers of non-crystalline semiconductors: A case study of unhydrogenated a-Si
Journal of Non-Crystalline Solids, Vol. 594
2021
2017
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Systematic Study of Oxygen Vacancy Tunable Transport Properties of Few-Layer MoO3− x Enabled by Vapor-Based Synthesis
Advanced Functional Materials, Vol. 27, Núm. 17
2015
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Phonon Engineering in Isotopically Disordered Silicon Nanowires
Nano Letters, Vol. 15, Núm. 6, pp. 3885-3893