Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Instituto de investigación
University System of Ohio
Columbus, Estados UnidosPublicaciones en colaboración con investigadores/as de University System of Ohio (1)
1999
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Effect of the temperature ramp rate during carbonization of Si (111) on the crystalline quality of SiC produced
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS