Instituto de investigación
Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Notas (3) Publicaciones en las que ha participado algún/a investigador/a
2016
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(S)TEM Analysis of the Strain and Morphology of InAs Quantum Dots using GaAs(Sb)(N) Capping Layers for Solar Cell Applications
Microscopy and Microanalysis
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HAADF-STEM analysis of the composition distribution in InAlAsSb/InGaAs/InP layers for solar cells applications
Microscopy and Microanalysis
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Structural quality of GaSb/GaAs quantum dots for solar cells analyzed by electron microscopy techniques
Microscopy and Microanalysis