Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
- López-Calle, I.
- Franco, F.J.
- Agapito, J.A.
- Izquierdo, J.G.
Actes de conférence:
Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011
ISBN: 9781424478637
Année de publication: 2011
Type: Communication dans un congrès