Quantification of corrugation in simulated graphene by electron tomography techniques
- Scavello, G.
- Pizarro, J.
- Maestre, J.F.
- Molina, S.I.
- Galindo, P.L.
Revue:
Applied Physics Letters
ISSN: 0003-6951
Année de publication: 2012
Volumen: 101
Número: 21
Type: Article