Accuracy assessment of strain mapping from Z -contrast images of strained nanostructures

  1. Guerrero, E.
  2. Galindo, P.L.
  3. Yán̈ez, A.
  4. Pizarro, J.
  5. Guerrero-Lebrero, M.P.
  6. Molina, S.I.
Journal:
Applied Physics Letters

ISSN: 0003-6951

Year of publication: 2009

Volume: 95

Issue: 14

Type: Article

DOI: 10.1063/1.3243990 GOOGLE SCHOLAR