High resolution electron microscopy of GaAs capped GaSb nanostructures
- Molina, S.I.
- Beltrán, A.M.
- Ben, T.
- Galindo, P.L.
- Guerrero, E.
- Taboada, A.G.
- Ripalda, J.M.
- Chisholm, M.F.
Revue:
Applied Physics Letters
ISSN: 0003-6951
Année de publication: 2009
Volumen: 94
Número: 4
Type: Article