Structural defects characterisation of GaInNAs MQWs by TEM and PL

  1. Herrera, M.
  2. González, D.
  3. García, R.
  4. Hopkinson, M.
  5. Navaretti, P.
  6. Gutiérrez, M.
  7. Liu, H.Y.
Actes de conférence:
IEE Proceedings: Optoelectronics

ISSN: 1350-2433

Année de publication: 2004

Volumen: 151

Número: 5

Pages: 385-388

Type: Article

DOI: 10.1049/IP-OPT:20040870 GOOGLE SCHOLAR
La source de données: Scopus