Correlation between the AlN buffer layer thickness and the GaN polarity in GaN/AlN/Si(111) grown by MBE
- Sanchez, A.M.
- Ruterana, P.
- Vennegues, P.
- Semond, F.
- Pacheco, F.J.
- Molina, S.I.
- Garcia, R.
- Sanchez-Garcia, M.A.
- Calleja, E.
Actas:
Materials Research Society Symposium - Proceedings
ISSN: 0272-9172
Ano de publicación: 2002
Volume: 743
Páxinas: 157-162
Tipo: Achega congreso