Characterisation by TEM and X-ray diffraction of linearly graded composition InGaAs buffer layers on (001) GaAs

  1. Pacheco, F.J.
  2. Araújo, D.
  3. Molina, S.I.
  4. García, R.
  5. Sacedón, A.
  6. González-Sanz, F.
  7. Calleja, E.
  8. Kidd, P.
  9. Lourenço, M.A.
Aldizkaria:
Materials Science and Technology

ISSN: 0267-0836

Argitalpen urtea: 1998

Alea: 14

Zenbakia: 12

Orrialdeak: 1273-1278

Mota: Artikulua

DOI: 10.1179/MST.1998.14.12.1273 GOOGLE SCHOLAR
Datuen iturria: Scopus