Control of the alumina microstructure to reduce gate leaks in diamond MOSFETs

  1. Gutiérrez, M.
  2. Lloret, F.
  3. Pham, T.T.
  4. Cañas, J.
  5. Reyes, D.F.
  6. Eon, D.
  7. Pernot, J.
  8. Araújo, D.
Revue:
Nanomaterials

ISSN: 2079-4991

Année de publication: 2018

Volumen: 8

Número: 8

Type: Article

DOI: 10.3390/NANO8080584 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus