Comparative study of the accuracy of characterization of thin films a-Si on glass substrates from their interference normal incidence transmittance spectrum by the Tauc-Lorentz-Urbach, the Cody-Lorentz-Urbach, the optimized envelopes and the optimized graphical methods
- Minkov, D.A.
- Angelov, G.V.
- Nestorov, R.N.
- Marquez, E.
- Blanco, E.
- Ruiz-Perez, J.J.
Revista:
Materials Research Express
ISSN: 2053-1591
Any de publicació: 2019
Volum: 6
Número: 3
Tipus: Article