Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry

  1. Gontard, L.C.
  2. López-Castro, J.D.
  3. González-Rovira, L.
  4. Vázquez-Martínez, J.M.
  5. Varela-Feria, F.M.
  6. Marcos, M.
  7. Calvino, J.J.
Aldizkaria:
Ultramicroscopy

ISSN: 1879-2723,  0304-3991

Argitalpen urtea: 2017

Alea: 177

Orrialdeak: 106-114

Mota: Artikulua

DOI: 10.1016/J.ULTRAMIC.2017.03.007 GOOGLE SCHOLAR
Datuen iturria: Scopus