Rare-earth oxides with fluorite-related structures: Their systematic investigation using HREM images, image simulations and electron diffraction pattern simulations

  1. López-Cartes, C.
  2. Pérez-Omil, J.A.
  3. Pintado, J.M.
  4. Calvino, J.J.
  5. Kang, Z.C.
  6. Eyring, L.
Revista:
Ultramicroscopy

ISSN: 0304-3991

Any de publicació: 1999

Volum: 80

Número: 1

Pàgines: 19-39

Tipus: Article

DOI: 10.1016/S0304-3991(99)00067-4 GOOGLE SCHOLAR
Font de les dades: Scopus