Method for determining the optical constants of thin dielectric films with variable thickness using only their shrunk reflection spectra
- Ruíz-Pérez, J.J.
- González-Leal, J.M.
- Minkov, D.A.
- Márquez, E.
ISSN: 0022-3727
Year of publication: 2001
Volume: 34
Issue: 16
Pages: 2489-2496
Type: Article