A new method for the optical characterization of inhomogeneous thin films based only on spectroscopic reflection measurements

  1. Ruiz-Pérez, J.J.
  2. Márquez, E.
  3. González-Leal, J.M.
  4. Jiménez-Garay, D.
  5. Minkov, D.
Liburu bilduma:
Materials Science Forum

ISSN: 1662-9752,  0255-5476

Argitalpen urtea: 1998

Alea: 287-288

Orrialdeak: 363-366

Mota: Artikulua

DOI: 10.4028/WWW.SCIENTIFIC.NET/MSF.287-288.363 GOOGLE SCHOLAR
Datuen iturria: Scopus