Developments in techniques and algorithms for materials-based electron tomography

  1. Midgley, P.A.
  2. Tong, J.R.
  3. Arslan, I.
  4. Hernandez, J.-C.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276,  1435-8115

Année de publication: 2009

Volumen: 15

Número: SUPPL. 2

Pages: 40-41

Type: Article

DOI: 10.1017/S1431927609092654 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus