Atom probe tomography analysis of InAlGaAs capped InAs/GaAs stacked quantum dots with variable barrier layer thickness
- Hernández-Saz, J.
- Herrera, M.
- Molina, S.I.
- Stanley, C.R.
- Duguay, S.
Revue:
Acta Materialia
ISSN: 1359-6454
Année de publication: 2016
Volumen: 103
Pages: 651-657
Type: Article