Atomic scale analysis of the effect of the SiO2 passivation treatment on InAs/GaSb superlattice mesa sidewall
- Herrera, M.
- Chi, M.
- Bonds, M.
- Browning, N.D.
- Woolman, J.N.
- Kvaas, R.E.
- Harris, S.F.
- Rhiger, D.R.
- Hill, C.J.
Revista:
Applied Physics Letters
ISSN: 0003-6951
Any de publicació: 2008
Volum: 93
Número: 9
Tipus: Article