Structural characterization of highly strained InAs N monolayer lasers and quantum well structures by X-ray diffraction and transmission electron microscopy

  1. Mazuelas, A.
  2. Molina, S.I.
  3. Aragón, G.
  4. Meléndez, J.
  5. Dotor, M.L.
  6. Huertas, P.
  7. Briones, F.
Aldizkaria:
Journal of Crystal Growth

ISSN: 0022-0248

Argitalpen urtea: 1993

Alea: 127

Zenbakia: 1-4

Orrialdeak: 596-600

Mota: Artikulua

DOI: 10.1016/0022-0248(93)90691-O GOOGLE SCHOLAR
Datuen iturria: Scopus