Simulation of transmission electron microscopy images using a generalized single-slice approach: The case of self-assembled quantum dots

  1. Gontard, L.C.
  2. Pizarro, J.
  3. Ruiz-Zafra, Á.
  4. Hernández-Saz, J.
Zeitschrift:
Materials Characterization

ISSN: 1044-5803

Datum der Publikation: 2020

Ausgabe: 164

Art: Artikel

DOI: 10.1016/J.MATCHAR.2020.110312 GOOGLE SCHOLAR
Datenquelle: Scopus