Enhanced sensitivity of CMOS image sensors by stacked diodes

  1. Lenero-Bardallo, J.A.
  2. Delgado-Restituto, M.
  3. Carmona-Galan, R.
  4. Rodriguez-Vazquez, A.
Revue:
IEEE Sensors Journal

ISSN: 1558-1748,  1530-437X

Année de publication: 2016

Volumen: 16

Número: 23

Pages: 8448-8455

Type: Article

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La source de données: Scopus