Calibration of thickness measurement instruments based on twin laser sensors. Isolines bilinear look up tables
- Spínola, C.
- Vázquez, M.J.M.
- Bohorquez, A.G.
- Bonelo, J.M.
- Vizoso, J.
Konferenzberichte:
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Datum der Publikation: 2001
Ausgabe: 2
Seiten: 1079-1083
Art: Konferenz-Beitrag