High resolution in STEM mode: Individual atom analysis in semiconductor nanowires
- De La Mata, M.
- Arbiol, J.
Liburua:
Transmission Electron Microscopy Characterization of Nanomaterials
ISBN: 9783642389337
Argitalpen urtea: 2014
Orrialdeak: 375-425
Mota: Liburuko kapitulua