Optical characterization of H-free a-Si layers grown by rf-magnetron sputtering by inverse synthesis using matlab: Tauc–lorentz–urbach parameterization

1. Márquez, E.
2. Ruíz-Pérez, J.J.
3. Ballester, M.
4. Márquez, A.P.
5. Blanco, E.
6. Minkov, D.
7. Fernández Ruano, S.M.
8. Saugar, E.

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DOI: 10.3390/COATINGS11111324 GOOGLE SCHOLAR lock_openOpen access editor

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