A methodology to improve yield in analog circuits by using geometric programming
- Sáenz, J.J.
- Roa, E.
- Pabón, A.A.
- Van Noije, W.
Konferenzberichte:
SBCCI'10 - Proceedings of the 23rd Symposium on Integrated Circuits and Systems Design
ISBN: 9781450302883
Datum der Publikation: 2010
Seiten: 140-145
Art: Konferenz-Beitrag