Análisis y evaluación de los modelos estadísticos para el diseño de circuitos integrados

  1. J.J. Sáenz-Noval 1
  2. E.F. Roa-Fuentes 1
  1. 1 Universidad Industrial de Santander, Escuela de Ingeniería Eléctrica y Electrónica
Revista:
Ingeniería, investigación y tecnología

ISSN: 1405-7743,  2594-0732

Any de publicació: 2011

Volum: 12

Número: 4

Tipus: Article

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Altres publicacions en: Ingeniería, investigación y tecnología

Resum

Statistical models for integrated circuits (IC) allow us to estimate the percentage of acceptable devices in the batch before fabrication. Actually, Pelgrom is the statistical model most accepted in the industry; however it was derived from a micrometer technology, which does not guarantee reliability in nanometric manufacturing processes. This work considers three of the most relevant statistical models in the industry and evaluates their limitations and advantages in analog design, so that the designer has a better criterion to make a choice. Moreover, it shows how several statistical models can be used for each one of the stages and design purposes.

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Fuente de los datos: Dialnet