Size and critical thickness evolution during growth of stacked layers of InAS/InP(001) quantum wires studied by in situ stress measurements
- Fuster, D
- Gonzalez, MU
- Gonzalez, L
- Gonzalez, Y
- Ben, T
- Ponce, A
- Molina, SI
- Norman, AG (coord.)
- Goldman, RS (coord.)
- Noetzel, R (coord.)
- Stringfellow, GB (coord.)
ISSN: 0272-9172
ISBN: 1-55899-732-6
Año de publicación: 2004
Volumen: 794
Páginas: 119-124
Congreso: Symposium on Self-Organized Processes in Semiconductor Epitaxy held at the 2003 MRS Fall Meeting
Tipo: Aportación congreso