Structural characterisation of AlGaN/AlN/Si(111) heterostructures by transmission electron microscopy
- Sanchez, AM
- Molina, SI
- Pacheco, FJ
- Garcia, R
- Sanchez-Garcia, MA
- Calleja, E
- Cullis, AG (coord.)
- Beanland, R (coord.)
ISSN: 0951-3248
ISBN: 0-7503-0650-5
Year of publication: 1999
Pages: 397-400
Congress: Conference on Microscopy of Semiconducting Materials
Type: Conference paper