TEM study of dislocation distribution in linearly-graded composition InGaAs layers on GaAs(001)
- PACHECO, FJ
- MOLINA, SI
- ARAUJO, D
- SACEDON, A
- GARCIA, R
- Jouffrey, B (coord.)
- Colliex, C (coord.)
ISBN: 2-86883-226-1
Datum der Publikation: 1994
Seiten: 609-610
Kongress: 13th International Congress on Electron Microscopy
Art: Konferenz-Beitrag