CHARACTERIZATION OF THE GAP/SI(001) INTERFACE BY TRANSMISSION ELECTRON-MICROSCOPY
- PACHECO, FJ
- KIELY, CJ
- MOLINA, SI
- ARAGON, G
- GARCIA, R
- Craven, AJ (coord.)
ISSN: 0951-3248
ISBN: 0-7503-0321-2
Ano de publicación: 1993
Páxinas: 317-320
Congreso: Conference of the Electron-Microscopy-and-Analysis-Group of the Institute-of-Physics: Electron Microscopy and Analysis 1993 (EMAG93)
Tipo: Achega congreso