Vertically Stacked CMOS-compatible Photodiodes for Scanning Electron Microscopy

  1. Gontard, Lionel C.
  2. Lenero-Bardallo, Juan A.
  3. Varela-Feria, Francisco M.
  4. Carmona-Galan, Ricardo
Collection de livres:
2020 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)

ISSN: 0271-4302

ISBN: 978-1-7281-3320-1

Année de publication: 2020

Congreso: IEEE International Symposium on Circuits and Systems (ISCAS)

Type: Communication dans un congrès

GOOGLE SCHOLAR
La source de données: WoS