Detection and quantification of small misalignments in nanometer-sized particles on oxide support systems by the analysis of plan view HREM images

  1. R.T. Baker
  2. J. J. Calvino
  3. C. López-Cartes
  4. C. Mira
  5. J. A. Pérez-Omil
  6. J. M. Rodríguez Izquierdo
Actas:
Electron Microscopy and Analysis Group Cont EMAG99, Sheffield

Año de publicación: 1999

Volumen: 161

Páginas: 537-540

Tipo: Aportación congreso

GOOGLE SCHOLAR

Resumen

The analysis of Plan View HREM images, using image processing and simulation,to retrieve infonnation about tbe orientation relationsbips between small, nanometer-sized,panicles and the crystalline suppon on wbicb they are grown is illustrated. Plan view images aredemonstrated to be much more sensitive tban edge-on views to rotations of the particles out ofperfect aJignment relationships. lt is also sbown1 how double diffraction effects amplify rotationsof very small amplitude. In the diffractograms experimental pararneters that measure the relativeposition of Moiré spots with respect to tbose of the suppon have been defined and proposed as away to quantifying rotations of even only a few degrees. Equations to derive tbe value of therotation angle from these experimental parameters bave been developed.