Impact of Sample Preparation Approach on Transmission Electron Microscopy Investigation of Sputtered AlNi Multilayers Used for Reactive Soldering

  1. Jiménez, J.J.
  2. Jaekel, K.
  3. Pauly, C.
  4. Schäfer, C.
  5. Bartsch, H.
  6. Mücklich, F.
  7. Morales, F.M.
Revista:
Advanced Engineering Materials

ISSN: 1527-2648 1438-1656

Año de publicación: 2024

Tipo: Artículo

DOI: 10.1002/ADEM.202302215 GOOGLE SCHOLAR