Publicaciones en las que colabora con DAVID GONZALEZ ROBLEDO (8)

2014

  1. Transmission electron microscopy of 1D-nanostructures

    Transmission Electron Microscopy Characterization of Nanomaterials (Springer Berlin Heidelberg), pp. 657-701

2012

  1. High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures

    Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62

1997

  1. EBIC and TEM investigations of laser heterostructures grown on linearly-graded and step-graded buffer layers

    MICROSCOPY OF SEMICONDUCTING MATERIALS 1997

1995

  1. Strain relaxation in step and linearly-graded InGaAs buffer layers on (001)GaAs

    MICROSCOPY OF SEMICONDUCTING MATERIALS 1995

1994

  1. Multilayer strain relaxation determination by XTEM in InGaAs step graded structures

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B

  2. Step-graded buffer layer study of the strain relaxation by transmission electron microscopy

    Materials Science and Engineering B, Vol. 28, Núm. 1-3, pp. 497-501

  3. Transmission electron microscopy study of InxGa1-xAs/GaAs multilayer buffer structures used as dislocation filters

    Materials Science and Engineering B, Vol. 28, Núm. 1-3, pp. 515-519

1993

  1. TEM AND PL STUDY OF STRAIN RELAXATION IN INGAAS/GAAS MQW STRUCTURES

    ELECTRON MICROSCOPY AND ANALYSIS 1993