Publicacións nas que colabora con S. J. Pennycook (18)

2013

  1. Influence of RF-sputtering power on formation of vertically stacked Si 1-x Ge x nanocrystals between ultra-thin amorphous Al 2 O 3 layers: Structural and photoluminescence properties

    Journal of Physics D: Applied Physics, Vol. 46, Núm. 38

2012

  1. Initial Results from a 200 kV UltraSTEM

    Microscopy and Microanalysis, Vol. 18, Núm. S2, pp. 326-327

  2. Tuning the properties of Ge-quantum dots superlattices in amorphous silica matrix through deposition conditions

    Journal of Applied Physics

2011

  1. Calculation of integrated intensities in aberration-corrected Z-contrast images

    Journal of Electron Microscopy, Vol. 60, Núm. 1, pp. 29-33

  2. Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy

    Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581

  3. Seeing inside materials by aberration-corrected electron microscopy

    International Journal of Nanotechnology, Vol. 8, Núm. 10-12, pp. 935-947

  4. Structural origin of enhanced luminescence efficiency of antimony irradiated InAs quantum dots

    Advanced Science Letters, Vol. 4, Núm. 11-12, pp. 3776-3778

2010

  1. Exploring semiconductor quantum dots and wires by high resolution electron microscopy

    Journal of Physics: Conference Series

  2. Morphological evolution of InAs/InP quantum wires through aberration-corrected scanning transmission electron microscopy

    Nanotechnology, Vol. 21, Núm. 32

2009

  1. Aberration-corrected scanning transmission electron microscopy: From atomic imaging and analysis to solving energy problems

    Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 367, Núm. 1903, pp. 3709-3733

  2. Column-by-column compositional mapping by Z-contrast imaging

    Ultramicroscopy, Vol. 109, Núm. 2, pp. 172-176

  3. Erratum to: "Column-by-column compositional mapping by Z-contrast imaging" [Ultramicroscopy 109(2) (2009) 172-176] (DOI:10.1016/j.ultramic.2008.10.008)

    Ultramicroscopy

2008

  1. A method to determine the strain and nucleation sites of stacked nano-objects

    Journal of Nanoscience and Nanotechnology, Vol. 8, Núm. 7, pp. 3422-3426

  2. Experimental and simulated strain field maps in stacked quantum wires

    Microscopy and Microanalysis

  3. Point defect configurations of supersaturated Au atoms inside Si nanowires

    Nano Letters, Vol. 8, Núm. 4, pp. 1016-1019

2007

  1. Direct imaging of quantum wires nucleated at diatomic steps

    Applied Physics Letters, Vol. 91, Núm. 14

  2. Incorporation of Sb in InAsGaAs quantum dots

    Applied Physics Letters, Vol. 91, Núm. 26

2006

  1. Determination of the strain generated in InAs/InP quantum wires: Prediction of nucleation sites

    Nanotechnology, Vol. 17, Núm. 22, pp. 5652-5658