JOAQUIN
PIZARRO JUNQUERA
Profesor Titular de Universidad
PEDRO LUIS
GALINDO RIAÑO
Catedrático de Universidad
Publicaciones en las que colabora con PEDRO LUIS GALINDO RIAÑO (45)
2019
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Effect of the thermal annealing and the nominal composition in the elemental distribution of InxAl1-xAsySb1-y for triple junction solar cells
Journal of Alloys and Compounds, Vol. 792, pp. 1021-1027
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Modified qHAADF method for atomic column-by-column compositional quantification of semiconductor heterostructures
Journal of Materials Science, Vol. 54, Núm. 4, pp. 3230-3241
2018
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Gaussian kernel density functions for compositional quantification in atom probe tomography
Materials Characterization, Vol. 139, pp. 63-69
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HAADF-STEM for the analysis of core–shell quantum dots
Journal of Materials Science, Vol. 53, Núm. 21, pp. 15226-15236
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Influence of the growth temperature on the composition distribution at sub-nm scale of InAlAsSb for solar cells
Journal of Alloys and Compounds, Vol. 763, pp. 1005-1011
2017
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Structural and Compositional Analysis of Core/Shell QDs by Transmission Electron Microscopy Techniques
Microscopy & Microanalysis 2017
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Structural characterization of InAlAsSb/InGaAs/InP heterostructures for solar cells
Applied Surface Science, Vol. 395, pp. 98-104
2016
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A distributed-memory parallel lattice Kinetic Monte Carlo algorithm for crystal growth applied to barite (001) face
Crystal Research and Technology, Vol. 51, Núm. 10, pp. 575-585
2015
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Synchronous parallel Kinetic Monte Carlo: Implementation and results for object and lattice approaches
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 352, pp. 27-30
2014
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A methodology for the extraction of quantitative information from electron microscopy images at the atomic level
Journal of Physics: Conference Series
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Preferential sites for InAsP/InP quantum wire nucleation using molecular dynamics
European Physical Journal B, Vol. 87, Núm. 11
2012
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High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
Springer Series in Materials Science (Springer Science and Business Media Deutschland GmbH), pp. 23-62
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Quantification of corrugation in simulated graphene by electron tomography techniques
Applied Physics Letters, Vol. 101, Núm. 21
2011
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ADART: An adaptive algebraic reconstruction algorithm for discrete tomography
IEEE Transactions on Image Processing, Vol. 20, Núm. 8, pp. 2146-2152
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Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy
Microscopy and Microanalysis, Vol. 17, Núm. 4, pp. 578-581
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Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes
Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
2010
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Three-dimensional acoustic lenses with axial symmetry
Applied Physics Letters, Vol. 97, Núm. 5
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Through-focal HAADF-STEM of buried nanostructures
Journal of Physics: Conference Series
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Transmission electron microscopy study of vertical quantum dots molecules grown by droplet epitaxy
Applied Surface Science, Vol. 256, Núm. 18, pp. 5659-5661
2009
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ASTROMETRIC POSITIONING OF GEOSTATIONARY SATELLITES (PASAGE)
XII IAU REGIONAL LATIN AMERICAN MEETING