Département
Física Aplicada
Articles (10) Publications auxquelles un chercheur a participé
1995
-
A new study of the Ag-photodissolution phenomenon in thin layers of the glassy As2S3.
Anales de física, Vol. 91, Núm. 1, pp. 36-44
-
Crystallization kinetics study of Fe-B-Si metallic glasses in the theoretical frame of the JMA model
Materials Letters, Vol. 24, Núm. 5, pp. 287-290
-
Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only
Applied Optics, Vol. 34, Núm. 34, pp. 7907-7913
-
Influence of temperature and interelectrode distance on the negative differential resistance in metal-chalcogenide glassy semiconductors
Journal of Materials Science, Vol. 30, Núm. 13, pp. 3407-3414
-
On the Electrical Switching Characteristics of the Bulk Metal Chalcogenide Glassy Semiconductor Cu0.10As0.40Se0.50 with a Double Point Contact Electrode System
physica status solidi (a), Vol. 147, Núm. 2, pp. 497-507
-
Optical characterization of wedge-shaped thin films of amorphous arsenic trisulphide based only on their shrunk transmission spectra
Thin Solid Films, Vol. 254, Núm. 1-2, pp. 83-91
-
Optical constants of thermally evaporated amorphous GeSe3 thin films
Journal of Materials Science, Vol. 30, Núm. 16, pp. 4133-4137
-
Optical properties of As50Se50 semiconducting glass films of non-uniform thickness deposited by thermal evaporation
Materials Chemistry & Physics, Vol. 40, Núm. 1, pp. 30-36
-
Relation between thermal history, structural relaxation and glass forming ability of an amorphous alloy in the chalcogenide ternary system AsSeTe
Thermochimica Acta, Vol. 249, Núm. C, pp. 221-230
-
Silver coordination hypotheses and structural model in the glassy semiconductor Ag0.04As0.38Se0.58 by X-ray diffraction
Materials Letters, Vol. 23, Núm. 1-3, pp. 79-86