Publicaciones en las que colabora con F. M. Varela Feria (2)

2020

  1. Vertically stacked CMOS-compatible photodiodes for scanning electron microscopy

    Proceedings - IEEE International Symposium on Circuits and Systems

2017

  1. Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry

    Ultramicroscopy, Vol. 177, pp. 106-114