Instituto de Microscopía Electrónica y Materiales (IMEYMAT)
Ikerketa institutua
Universidade do Minho
Braga, PortugalUniversidade do Minho-ko ikertzaileekin lankidetzan egindako argitalpenak (2)
2013
-
Influence of RF-sputtering power on formation of vertically stacked Si
1-x
Ge
x
nanocrystals between ultra-thin amorphous Al
2
O
3
layers: Structural and photoluminescence properties
Journal of Physics D: Applied Physics, Vol. 46, Núm. 38